Browse "School of Electrical Engineering(전기및전자공학부)" by Subject intercell margin
Showing results 1 to 1 of 1
| Lithography Defect Probability and Its Application to Physical Design Optimization Shim, Seongbo; Chung, Woohyun; Shin, Youngsoo, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.25, no.1, pp.271 - 285, 2017-01 |
Discover
Open Access
- 573 OA Article
Date issued
- 4,855 2020 - 2024
- 18,943 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989