Showing results 4 to 5 of 5
Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current Lee, Jung-Woo; Han, Joon-Kyu; Kim, Myung-Su; Yu, Ji-Man; Jung, Jin-Woo; Yun, Seong-Yun; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.11, pp.6133 - 6138, 2022-11 |
Spontaneous heteroassembly of 2D semiconducting van der Waals materials in random solution phase Padmajan Sasikala, Suchithra; Kim, Sung Hyun; Park, Cheolmin; Kim, Dong-Ha; Jung, Hong Ju; Jung, Juhyung; Lee, Hojin; et al, MATERIALS TODAY, v.58, pp.18 - 29, 2022-09 |
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