Browse "School of Electrical Engineering(전기및전자공학부)" by Subject H-2

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Revealing the Loss Mechanism of Chemically-Induced Hot Electron Transport

Roh, Yujin; Jin, Yeonghoon; Jeon, Beomjoon; Park, Yujin; Yu, Kyoungsik; Park, Jeong Young, NANO LETTERS, v.24, no.11, pp.3490 - 3497, 2024-03

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