Browse "School of Electrical Engineering(전기및전자공학부)" by Subject nitride

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Lanthanum-Oxide-Doped Nitride Charge-Trap Layer for a TANOS Memory Device

Park, Jong-Kyung; Park, Young-Min; Lee, Seok-Heeresearcher; Iim, Sung-Kyu; Oh, Jae-Sub; Joo, Moon-Sig; Hong, Kwon; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.10, pp.3314 - 3320, 2011-10

Performance Improvement in Charge-Trap Flash Memory Using Lanthanum-Based High-k Blocking Oxide

He, Wei; Pu, Jing; Chan, Daniel S. H.; Cho, BJ; Pu, J; Cho, Byung Jinresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.56, no.11, pp.2746 - 2751, 2009-11



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