Browse "School of Electrical Engineering(전기및전자공학부)" bySubjectnative oxide

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Reduction of charge trapping in HfO2 film on a Ge substrate by trimethylaluminum pretreatment

Lee, Jae Jin; Shin, Yunsang; Choi, Juyun; Kim, Hyoungsub; Hyun, Sangjin; Choi, Siyoung; Cho, Byung Jinresearcher; et al, PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.6, no.11, pp.439 - 441, 2012-11

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