Browse "School of Electrical Engineering(전기및전자공학부)" by Subject inversion channel charge
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| Analytical drain thermal noise current model valid for deep submicron MOSFETs Han, Kwang-Seok; Shin, Hyung-Cheol; Lee, Kwy-Ro, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.51, pp.261 - 269, 2004-02 |
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