Browse "School of Electrical Engineering(전기및전자공학부)" by Subject intercell margin

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Lithography Defect Probability and Its Application to Physical Design Optimization

Shim, Seongbo; Chung, Woohyun; Shin, Youngsooresearcher, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.25, no.1, pp.271 - 285, 2017-01

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