Browse "School of Electrical Engineering(전기및전자공학부)" by Subject gate-all-around MOSFET

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Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Moon, Joon-Bae; Moon, Dong-Il; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.61, no.3, pp.1420 - 1425, 2014-06

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