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A simple flash memory cell model for transient circuit simulation Kang, YH; Hong, Songcheol, IEEE ELECTRON DEVICE LETTERS, v.26, no.8, pp.563 - 565, 2005-08 |
High- κ 유전체를 사용한 Charge-trapping type플래쉬 메모리 소자에서 데이터 Retention 특성과 Erase 속도 개선 = Improvement of data retention and erase speed in charge-trapping type flash memory devices using high-κ dielectriclink 박종경; Park, Jong-Kyung; et al, 한국과학기술원, 2010 |
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