Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Interface trap

Showing results 1 to 3 of 3

1
Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain

Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Park, Jun-Young; Choi, Yang-Kyu, MICROELECTRONICS RELIABILITY, v.104, 2020-01

2
Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability

Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12

3
Surface treatment effects on the electrical properties of insulator/HgCdTe interface = 표면 처리가 절연막과 HgCdTe 간 계면의 전기적 특성에 미치는 영향link

Lee, Seong-Hoon; 이성훈; et al, 한국과학기술원, 1998

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