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Double-Gate and Body-Contacted Nonvolatile Oxide Memory Thin-Film Transistors for Fast Erase Programming Yang, Jong-Heon; Byun, Chun-Won; Pi, Jae-Eun; Kim, Hee-Ok; Hwang, Chi-Sun; Yoo, Seunghyup, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.120 - 126, 2022-01 |
Effects of the oxygen vacancy concentration in InGaZnO-Based RRAM = InGaZnO물질기반의 RRAM 소자에 산소 결핍 농도의 효과에 관한 연구link Kim, Moon-Seok; 김문석; et al, 한국과학기술원, 2013 |
The influence of visible light on the gate bias instability of In-Ga-Zn-O thin film transistors Kim, Sangwook; Kim, Sunil; Kim, Changjung; Park, JaeChul; Song, Ihun; Jeon, Sanghun; Ahn, Seung-Eon; et al, SOLID-STATE ELECTRONICS, v.62, no.1, pp.77 - 81, 2011-08 |
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