Browse "School of Electrical Engineering(전기및전자공학부)" by Subject INSTABILITY
Showing results 1 to 5 of 5
| Defects and Charge-Trapping Mechanisms of Double-Active-Layer In-Zn-O and Al-Sn-Zn In-O Thin-Film Transistors Goh, Youngin; Kim, Taeho; Yang, Jong-Heon; Choi, Ji Hun; Hwang, Chi-Sun; Cho, Sung Haeng; Jeon, Sanghun, ACS APPLIED MATERIALS & INTERFACES, v.9, no.11, pp.9271 - 9279, 2017-03 |
| Fast and slow transient charging of Oxide Semiconductor Transistors Kim, Taeho; Park, Sungho; Jeon, Sanghun, SCIENTIFIC REPORTS, v.7, 2017-09 |
| Inter-channel interference in multispan WDM transmissions around perfect dispersion-compensated region Chen, J; Kim, Hoon; Chung, Yun Chur, OPTICS COMMUNICATIONS, v.213, no.4-6, pp.367 - 371, 2002-12 |
| Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John, SCIENTIFIC REPORTS, v.5, 2015-10 |
| Pulse I-V characterization of a nanocrystalline oxide device with sub-gap density of states Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.27, no.21, 2016-05 |
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