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Highly Reliable Charge Trap-Type Organic Non-Volatile Memory Device Using Advanced Band-Engineered Organic-Inorganic Hybrid Dielectric Stacks Kim, Min Ju; Lee, Changhyeon; Shin, Eui Joong; Lee, Tae In; Kim, Seongho; Jeong, Jaejoong; Choi, Junhwan; et al, ADVANCED FUNCTIONAL MATERIALS, v.31, no.41, 2021-10 |
Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy Baik, Seung Jae; Lim, Koeng Su; Choi, Wonsup; Yoo, Hyunjun; Lee, Jang-Sik; Shin, Hyunjung, NANOSCALE, v.3, no.6, pp.2560 - 2565, 2011 |
Time dependent hot-carrier induced interface state generation in deep submicron LDD nMOSFETs Kim, SH; Min, KS; Lee, Kwyro, SOLID-STATE ELECTRONICS, v.39, no.3, pp.405 - 410, 1996-03 |
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