Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Erasing saturation
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| Investigation of gate length and fringing field effects for program and erase efficiency in gate-all-around SONOS memory cells Kim, Moon-Seok; Choi, Sung-Jin; Moon, Dong-Il; Duarte, Juan P.; Kim, Sung-Ho; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.79, pp.7 - 10, 2013-01 |
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