Browse "School of Electrical Engineering(전기및전자공학부)" bySubjectBolometric studies

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Influence of passivation layer on thermal stability of Nb:TiO2-x samples for shutter-less infrared image sensors

Reddy, Y. Ashok Kumar; Ajitha, B.; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chulresearcher, INFRARED PHYSICS & TECHNOLOGY, v.100, pp.52 - 56, 2019-08

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