Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Bending stability
Showing results 1 to 1 of 1
| Performance Degradation of Flexible Si Nanomembrane Transistors with Al2O3 and SiO2 Dielectrics under Mechanical Stress Kim, Seung-Yoon; Bong, Jae Hoon; Kim, Dong Jun; Kim, Choong Sun; Choi, Hyeongdo; Hwang, Wan Sik; Cho, Byung-Jin, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.7, pp.3069 - 3072, 2018-07 |
Discover
Open Access
- 573 OA Article
Date issued
- 4,865 2020 - 2024
- 18,943 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989