Showing results 1 to 8 of 8
A 6.4Gbps On-chip Eye Opening Monitor Circuit for Signal Integrity Analysis of High Speed Channel Kim, Joungho; Shin, Mincheol; Shim, Jongjoo; Kim, Jaemin; Pak, Jun So; Hwang, Chulsoon; Yoon, Changwook; et al, Presented at Proceeding of 2008 IEEE EMC Symposium, pp.1 - 7, 2008-08 |
A fast statistical eye-diagram estimation method for high-speed channel including non-linear receiver circuit Kim, Hee-Gon; Kim, Kiyeong; Kim, Jingook; Yoon, Changwook; Kim, Hyungsoo; Kim, Jonghoon J; Kim, Joungho, DesignCon 2015, UBM Electronics, 2015-01 |
A Noise Coupling Effect on Reference Voltage Level of Triggering Circuit in Non-coherent UWB Communication System Kim, Joungho; Yoon, Changwook; Shin, Minchul; Shim, Yujeong; Kim, Myunghoi; Cho, Jeonghyeon, EMC Kyoto Symposium, 2009 |
An On-Chip Spectrum Analyzer for Signal Integrity Kim, Joungho; Cho, Jeonghyeon; Lee, Woojin; Song, Eakhwan; Shim, Jongjoo; Shin, Minchul; Yoon, Changwook, EMC Kyoto Symposium, 2009 |
Analysis of DLL Jitter Affected by Power Supply Noise on Power Distribution Network Kim, Joungho; Shin, Minchul; Yoon, Changwook; Cho, Jeonghyeon; Shim, Jongjoo; Shim, Yujeong, EMC Kyoto Symposium, 2009 |
On-Chip Linear Voltage Regulator Module (VRM) Effect on Power Distribution Network (PDN) Noise and Jitter at High-Speed Output Buffer Kim, Joungho; Kim, Sukjin; Yoon, Changwook; Kim, Jingook; Brice Achkir; Jun Fan, 2015 IEEE Sympositum on Electromagnetic Compatibility & Signal Integrity, 2015 IEEE Sympositum on Electromagnetic Compatibility & Signal Integrity, 2015-03-15 |
On-chip Voltage Regulator Module (VRM) Effect on Power/Ground Noise and Jitter at High-speed Output Buffer Kim, Joung-Ho; Kim, Heegon; Yoon, Changwook; Kim, Jingook; Brice Achkir, 2014 IEEE International Symposium on Electromagnetic Compatibility(EMC&SIPI), 2014 IEEE International Symposium on Electromagnetic Compatibility(EMC&SIPI), 2014-08-03 |
Power/ground Noise Immunity Test in Wireless and High-speed UWB Communication System Kim, Joungho; Yoon, Changwook; Park, Hyunjeong; Lee, Woojin; Shin, Minchul; Pak, Jun So, IEEE Electromagnetic Compatibility Symposium, EMC, pp.1 - 6, 123, 2007-12 |
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