Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yoo, S.
Showing results 1 to 7 of 7
| A 1.8dB NF 112mW single-chip diversity tuner for 2.6GHz S-DMB applications Hwang, M.-W.; Beck, S.; Min, S.; Lee, S.; Yoo, S.; Lim, K.; Jung, H.; et al, 2006 IEEE International Solid-State Circuits Conference, ISSCC, IEEE, 2006-02-06 |
| A fully-integrated low power direct conversion transmitter with fractional-N PLL using a fast AFC technique for CDMA applications Hwang, M.-W.; Lee, J.-C.; Beck, S.; Yoo, S.; Lim, K.; Jung, H.; Lee, T.-H.; et al, 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Digest of Papers, pp.679 - 682, IEEE, 2005-06-12 |
| A novel PAPR reduction scheme for OFDM systems: Selective mapping of partial tones (SMOPT) Yoo, S.; Yoon, S.; Kim, S.Y.; Song, Iickho, International Conference on Consumer Electronics, ICCE '06, pp.287 - 288, IEEE, 2006-01-07 |
| An analytical dynamic scaling of supply voltage and body bias exploiting memory stall time variation Kim, J.; Lee, Y.; Yoo, S.; Kyung, Chong-Min, 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010, pp.575 - 580, 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010, 2010-01-18 |
| Event statistics and criticality-aware bitrate allocation to minimize energy consumption of memory-constrained wireless surveillance system Kim, J.; Kim, J.; Kim, G.; Na, S.; Yoo, S.; Kyung, Chong-Min, IEEE International Conference on Multimedia and Expo, ICME 2010, pp.7 - 12, IEEE, 2010-07-19 |
| Maximizing throughput of temperature-constrained multi-core systems with 3D-stacked cache memory Kang, K.; Jung, J.; Yoo, S.; Kyung, Chong-Min, 12th International Symposium on Quality Electronic Design, ISQED 2011, pp.577 - 582, 12th International Symposium on Quality Electronic Design, ISQED 2011, 2011-03-14 |
| Organic/inorganic hybrid gate dielectric for high-performance and low-power organic thin-film transistors Shin, W.C.; Moon, H.; Yoo, S.; Cho, Byung Jin, 2010 10th IEEE Conference on Nanotechnology, NANO 2010, pp.936 - 939, IEEE, 2010-08-17 |
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