Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yoo, Hyunjun
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| Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy Baik, Seung Jae; Lim, Koeng Su; Choi, Wonsup; Yoo, Hyunjun; Lee, Jang-Sik; Shin, Hyunjung, NANOSCALE, v.3, no.6, pp.2560 - 2565, 2011 |
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