Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yonghun Kim
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| Characterization of Ultra-Thin Dielectric Using Time Domain Reflectometry Yonghun Kim; Seung-heon Baek; Changhoon Jeon; Young Gon Lee; JinJu Kim; Ukjin Jung; Lee, Seok-Hee; et al, International Workshop on DIELECTRIC THIN FILMS FOR FUTURE ELECTRON DEVICES - SCIENCE AND TECHNOLOGY - (IWDTF), pp.113 - 114, The Japan Society of Applied Physics, 2013-11-08 |
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