Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yong, YF
Showing results 1 to 1 of 1
| Correlation between interface traps and gate laeakage in ultra-thin silicon dioxide Cho, Byung Jin; Loh, WY; Li, MF; Lek, CM; Yong, YF; Joo, MS, 9th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.246 - 246, 2002-07-08 |
Discover
Open Access
- 573 OA Article
Date issued
- 4,870 2020 - 2024
- 18,943 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989