Browse "School of Electrical Engineering(전기및전자공학부)" by Author VU, T

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A NEW INTERPRETATION OF END RESISTANCE MEASUREMENTS

Lee, Kwyro; SHUR, M; LEE, KW; VU, T; ROBERTS, P; HELIX, M, IEEE ELECTRON DEVICE LETTERS, v.5, no.1, pp.5 - 7, 1984

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