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Bake stability of CdTe and ZnS on HgCdTe: An x-ray photoelectron spectroscopy study Jha, SK; Srivastava, P; Pal, R; Anjali; Sehgal, HK; Lee, Hee Chul; Agnihotri, OP; et al, JOURNAL OF ELECTRONIC MATERIALS, v.32, no.8, pp.899 - 905, 2003-08 |
Dependence of hydrogen and oxygen incorporation on deposition parameters in photochemical vapor deposited mercury free silicon nitride films Sahu, BS; Srivastava, P; Agnihotri, OP; Lee, Hee Chul; Sekhar, BR; Mahapatra, S, THIN SOLID FILMS, v.446, pp.23 - 28, 2004-01 |
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