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Dislocation effects in FinFETs for different III-V compound semiconductors Hur, Ji-Hyun; Jeon, Sanghun, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.49, no.15, 2016-04 |
Dislocation scatterings in p-type Si1-xGex under weak electric field Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.26, no.49, 2015-12 |
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