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Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor Goh, Youngin; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.8, pp.3264 - 3268, 2018-08 |
Study on the Discharge Modes of the Microplasma Generated in a Plasma Display With an Auxiliary Electrode Kim, SH; Mun, JH; Choi, Kyung Cheol, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.37, pp.327 - 333, 2009-02 |
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