Browse "School of Electrical Engineering(전기및전자공학부)" by Subject SCANNING ELECTRON-MICROSCOPY
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| Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10 |
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