Browse "School of Electrical Engineering(전기및전자공학부)" by Subject MEAN SQUARED ERROR
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| A Novel Image Quality Assessment With Globally and Locally Consilient Visual Quality Perception Bae, Sung-Ho; Kim, Mun-Churl, IEEE TRANSACTIONS ON IMAGE PROCESSING, v.25, no.5, pp.2392 - 2406, 2016-05 |
| DCT-QM: A DCT-Based Quality Degradation Metric for Image Quality Optimization Problems Bae, Sung-Ho; Kim, Mun-Churl, IEEE TRANSACTIONS ON IMAGE PROCESSING, v.25, no.10, pp.4916 - 4930, 2016-10 |
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