Browse "School of Electrical Engineering(전기및전자공학부)" by Subject DC STRESS

Showing results 1 to 1 of 1

1
EFFECTS OF ELECTRON-BEAM DAMAGE ON THE ELECTRICAL CHARACTERISTICS OF N-TYPE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTORS

Park, Sin Chong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.3A, pp.1223 - 1227, 1994

Discover

Type

. next

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0