Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yu, SH
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| Effect of Ti deposition temperature on TiSi2 orientation and its thermal instability in heavility doped Si Cho, Byung Jin; Park, BH; Yu, SH; Kim, JC, 1996 Spring Meeting of Materials Research Society of Korea, pp.0 - 0, 1996-05-17 |
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