Browse "School of Electrical Engineering(전기및전자공학부)" by Author Young, Ian
Showing results 1 to 2 of 2
| Scalable In-Memory Clustered Annealer with Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems Ku, Anni; Hur, Jae; Luo, Yuan-Chun; LI, Hai; Nikonov, Dmitri E.; Young, Ian; Choi, Yang-Kyu; et al, IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS, v.13, no.1, pp.422 - 435, 2023-03 |
| Scalable in-memory clustered annealer with temporal noise of FinFET for the travelling salesman problem Lu, Anni; Choi, Yang-Kyu; Hur, Jae; Luo, Yuan-Chun; Li, Hai; Nikonov, Dmitri; Young, Ian; et al, 68th IEEE International Electron Devices Meeting, IEDM 2022, IEEE, 2022-12-03 |
Discover
Open Access
- 573 OA Article
Date issued
- 5,011 2020 - 2024
- 18,940 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989