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EXTRINSIC VERSUS INTRINSIC MODELS FOR FETS YTTERDAL, T; FJELDLY, TA; Lee, Kwyro, PHYSICA SCRIPTA, v.54, pp.139 - 140, 1994 |
NEW APPROACH FOR MODELING OF CURRENT DEGRADATION IN HOT-ELECTRON DAMAGED LDD NMOSFETS YTTERDAL, T; KIM, SH; Lee, Kwyro; FJELDLY, TA, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.42, no.2, pp.362 - 365, 1995-02 |
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