Browse "School of Electrical Engineering(전기및전자공학부)" by Author Oh, J.-S.
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| Ultimately scaled 20nm unified-RAM Moon, D.-I.; Choi, S.-J.; Kim, C.-J.; Kim, J.-Y.; Lee, J.-S.; Oh, J.-S.; Lee, G.-S.; et al, 2010 IEEE International Electron Devices Meeting, IEEE, 2010-12-06 |
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