Browse "School of Electrical Engineering(전기및전자공학부)" by Author OH, DK
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| EFFECT OF STRESS SIGN AND FILM THICKNESS ON INTERFACE NUCLEATION OF MISFIT DISLOCATIONS IN STRAINED MULTILAYERS Park, HyoHoon; YOO, JB; OH, DK; KIM, JS; Lee, JeongYong, JOURNAL OF APPLIED PHYSICS, v.75, no.10, pp.4990 - 4993, 1994-05 |
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