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First Demonstration of Junctionless Accumulation-Mode Bulk FinFETs With Robust Junction Isolation Kim, Tae Kyun; Kim, Dong Hyun; Yoon, Young Gwang; Moon, Jung Min; Hwang, Byeong Woon; Moon, Dong-Il; Lee, Gi Seong; et al, IEEE ELECTRON DEVICE LETTERS, v.34, no.12, pp.1479 - 1481, 2013-12 |
High Throughput Ultralong (20 cm) Nanowire Fabrication Using a Wafer-Scale Nanograting Template Yeon, Jeongho; Lee, Young Jae; Yoo, Dong Eun; Yoo, Kyoung Jong; Kim, Jin Su; Lee, Jun; Lee, Jeong Oen; et al, NANO LETTERS, v.13, no.9, pp.3978 - 3984, 2013-09 |
Sub-5nm All-Around Gate FinFET for Ultimate Scaling Lee, Hyunjin; Yu, Lee-Eun; Ryu, Seong-Wan; Han, Jin-Woo; Jeon, Kanghoon; Jang, Dong-Yoon; Kim, Kuk-Hwan; et al, IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, 2006-06-13 |
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