Browse "School of Electrical Engineering(전기및전자공학부)" by Author Lee, BH

Showing results 1 to 9 of 9

1
A 10-bit Modified VCC Interpolation and DVO Correction Using Drain-Current Injection

Cho, Gyu-Hyeong; Lee, SW; Park, GS; Kim, KD; Park, CB; Lee, BH; Jeon, JY; et al, SID 10 DIGEST, pp.58 - 61, SID 10 DIGEST, 2010-05-28

2
A probe detection model using the analysis of the fuzzy cognitive maps

Lee, SY; Kim, YS; Lee, BH; Kang, SH; Youn, ChanHyun, COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2005, PT 1 BOOK SERIES: LECTURE NOTES IN COMPUTER SCIENCE, v.3480, pp.320 - 328, 2005

3
Adaptive Link Voltage Variation (ALVV) Control for High Efficiency in High Power Density Adapter

Kim, BC; Lee, BH; Park, KB; Kim, CE; Ryu, BW; Moon, GW; Youn, Myung Joong, Power Electronics Annual Conference 2008, 전력전자학회, 2008-06

4
Board-to-board optical interconnection system using optical slots

Cho, IK; Yoon, KB; Ahn, SH; Jeong, MY; Sung, HK; Lee, BH; Heo, YU; et al, IEEE PHOTONICS TECHNOLOGY LETTERS, v.16, no.7, pp.1754 - 1756, 2004-07

5
Design and implementation of MP lambda S network simulator

Lee, BH; Jung, IH; Youn, ChanHyun, FUTURE GENERATION COMPUTER SYSTEMS, v.20, no.2, pp.339 - 347, 2004-02

6
QoS-constrained resource allocation for a Grid-based multiple source electrocardiogram application

Nam, DS; Youn, ChanHyun; Lee, BH; Clifford, G; Healey, J, COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2004, PT 1 BOOK SERIES: LECTURE NOTES IN COMPUTER SCIENCE, v.3043, pp.352 - 359, 2004

7
Resource reconfiguration policy based on execution time estimation in computational grids

Youn, ChanHyun; Kim, B.-S.; Nam, D.-S.; Lee, BH; Shim, EB; Clifford, G; Healey, J, 6th International Conference on Advanced Communication Technology: Broadband Convergence Network Infrastructure, v.2, pp.1066 - 1071, 2004-02-09

8
Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS

Kim, HO; Lee, BH; Kim, JT; Choi, JY; Choi, KM; Shin, Youngsoo, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.18, no.3, pp.505 - 509, 2010-03

9
The effect of Ge composition and Si cap thickness on hot carrier reliability of Si/Si1-xGex/Si p-MOSFETs with high-K/metal gate

Cho, Byung Jin; Loh, WY; Majhi, P; Lee, SH; Oh, JW; Sassman, B; Young, C; et al, 2008 Symposium on VLSI Technology, pp.56 - 57, 2008-06-17

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