Showing results 1 to 6 of 6
A neural network model for detection systems based on date mining and false errors Lee, S.-Y.; Lee, B.-H.; Kim, Y.-D.; Shin, D.-M.; Youn, ChanHyun, EUC 2006: Embedded and Ubiquitous Computing Workshops, pp.629 - 638, 2006-08-01 |
A secure mobile healthcare system based on surrogate host Cho, H.-S.; Lee, B.-H.; Kim, M.-K.; Lee, S.-Y.; Youn, ChanHyun, 6th IEEE International Conference on Computer and Information Technology, CIT 2006, 2006-09-20 |
Adaptive link voltage variation (ALVV) control for high power density adapter Kim, B.-C.; Lee, B.-H.; Park, K.-B.; Kim, C.-E.; Ryu, B.-W.; Moon, G.-W.; Youn, Myung Joong, PESC '08 - 39th IEEE Annual Power Electronics Specialists Conference, pp.1022 - 1027, 123, 2008-06-15 |
An operation and maintenance scheme for optical burst-switched networks Cho, J.-J.; Jin, G.-J.; Song, H; Youn, ChanHyun; Lee, B.-H., 6th International Conference on Advanced Communication Technology: Broadband Convergence Network Infrastructure, v.1, pp.458 - 461, 2004-02-09 |
Policy-based resource management mechanism for dynamic grid environments Han, Y.; Song, H.; Youn, ChanHyun; Shim, E.; Lee, B.-H., IEEE Sarnoff Symposium, SARNOFF 2007, 2007-04-30 |
The effects of Ge composition and Si cap thickness on hot carrier reliability of Si/Sil-xGex/Si p-MOSFETs with high-K/metal gate Loh, W.-Y.; Majhi, P.; Lee, S.-H.; Oh, J.-W.; Sassman, B.; Young, C.; Bersuker, G.; et al, 2008 Symposium on VLSI Technology Digest of Technical Papers, VLSIT, pp.56 - 57, 2008-06-17 |
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