Browse "School of Electrical Engineering(전기및전자공학부)" by Author LI, Hai
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| Scalable In-Memory Clustered Annealer with Temporal Noise of Charge Trap Transistor for Large Scale Travelling Salesman Problems Ku, Anni; Hur, Jae; Luo, Yuan-Chun; LI, Hai; Nikonov, Dmitri E.; Young, Ian; Choi, Yang-Kyu; et al, IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS, v.13, no.1, pp.422 - 435, 2023-03 |
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