Browse "School of Electrical Engineering(전기및전자공학부)" by Author Jang, S.-A.

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Anomalous field-oxide-ungrowth phenomenon in recessed local oxidation of silicon isolation structure

Cho, Byung Jin; Jang, S.-A.; Kim, Y.-B.; Lee, D.-D.; Kim, J.-C., JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.144, no.1, pp.320 - 326, 1997-01

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