Browse "School of Electrical Engineering(전기및전자공학부)" by Author Ha, J.

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Secrecy capacity over correlated ergodic fading channel

Jeon, H.; Kim, N.; Kim, M.; Lee, HyuckJae; Ha, J., 2008 IEEE Military Communications Conference, MILCOM 2008 - Assuring Mission Success, pp.0 - 0, IEEE, 2008-11-17

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