Browse "School of Electrical Engineering(전기및전자공학부)" by Author GO, HYOJUN

Showing results 1 to 2 of 2

1
Exploiting Doubly Adversarial Examples for Improving Adversarial Robustness

BYUN, JUNYOUNG; GO, HYOJUN; Cho, Seungju; Kim, Changick, IEEE International Conference on Image Processing, ICIP 2022, pp.1331 - 1335, IEEE, 2022-10

2
Hidden Conditional Adversarial Attacks

Byun, JunYoung; Shim, KyuJin; GO, HYOJUN; Kim, Changick, IEEE International Conference on Image Processing, ICIP 2022, pp.1306 - 1310, IEEE, 2022-10

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