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Bake stability of CdTe and ZnS on HgCdTe: An x-ray photoelectron spectroscopy study Jha, SK; Srivastava, P; Pal, R; Anjali; Sehgal, HK; Lee, Hee Chul; Agnihotri, OP; et al, JOURNAL OF ELECTRONIC MATERIALS, v.32, no.8, pp.899 - 905, 2003-08 |
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