Showing results 1 to 5 of 5
Analysis of Static Imprint Phenomenon in Ferroelectric VDF-TrFE Copolymer Film for Nonvolatile Memory Devices Kim, Woo-Young; Lee, Yong-Soo; Lee, Hee-Chul; Ka, Du-Youn; Kim, Sang-Youl, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.57, pp.1690 - 1694, 2010-12 |
Internal Bias Field in Ferroelectric Polymer Thin Film for Nonvolatile Memory Applications Kim, Woo-Young; Ka, Du-Youn; Kim, Dong-Soo; Kwon, Il-Woong; Kim, Sang-Youl; Lee, Yong-Soo; Lee, Hee-Chul, IEEE ELECTRON DEVICE LETTERS, v.31, no.5, pp.482 - 484, 2010-05 |
Passive matrix-addressable memory apparatus Lee, Hee Chul; Kim, Woo-Young; Hwang, Chi-Ho; Lee, Yong-Soo; Kim, Sang-Youl; Ka, Du-Youn, 2011-08-02 |
Patterning of ferroelectric poly(vinylidene fluoride-trifluoroethylene) film for nonvolatile memory devices Kim, Woo-Young; Lee, Hee-Chul; Ka, Du-Youn; Kwon, Il-Woong; Kim, Dong-Soo; Lee, Yong-Soo; Kim, Sang-Youl, CURRENT APPLIED PHYSICS, v.11, no.3, pp.341 - 344, 2011-05 |
Retention Performance of Ferroelectric Polymer Film for Nonvolatile Memory Devices Kim, Woo-Young; Ka, Du-Youn; Cho, Byeong-Ok; Kim, Sang-Youl; Lee, Yong-Soo; Lee, Hee-Chul, IEEE ELECTRON DEVICE LETTERS, v.30, no.8, pp.822 - 824, 2009-08 |
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