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Using the CESM Shell to Classify Wafer Defects from Visual Data Chi, Sungd-Do; Zeigler, Bernard P.; Kim, Tag-Gon, SPIE 89, pp.66 - 70, SPIE, 1989-11 |
Variable structure modelling methodology: An adaptive computer architecture example Zeigler, Bernard P.; Kim, Tag-Gon; Lee, Chilgee, TRANSACTIONS OF THE SOCIETY FOR COMPUTER SIMULATION, v.7, no.4, pp.291 - 319, 1990-12 |
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