Browse "School of Electrical Engineering(전기및전자공학부)" by Author Lee, Ho-Jun
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| X-ray irradiation induced damage in MOS structures and it's effect on oxide reliability Lee, Kwyro; Han, Chul-Hi; Kim, Shi-Ho; Lee, Ho-Jun; Choi, Sang-Soo; Jeon, Young-Jin; Fabrizio, Enzo Di; et al, Technical Digest of 3rd International Conference on VLSI and CAD, pp.20 - 23, 1993 |
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