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Spectroscopic ellipsometry studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Rodriguez-Viejo, J; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, pp.782 - 790, 2004-03 |
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