Showing results 10 to 13 of 13
Spectroscopic Ellipsometry Studies on Boron Ion implanted Cd0.96Zn0.04Te Lee, Hee Chul; Sridharan, M; Narayandass, SK; Mangalaraj, D, ASIP-2002, pp.0 - 0, 2002-08-01 |
Spectroscopic ellipsometry studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Rodriguez-Viejo, J; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, pp.782 - 790, 2004-03 |
Studies on polycrystalline Cd0.96Zn0.04Te thin films prepared by vacuum evaporation Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, VACUUM, v.70, pp.511 - 522, 2003-04 |
X-ray diffraction and Raman scattering studies in B-10(+)-implanted Cd0.96Zn0.04Te thin films prepared by vacuum evaporation Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.14, pp.69 - 73, 2003-02 |
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