Browse "School of Electrical Engineering(전기및전자공학부)" by Author Lee, BH
Showing results 8 to 9 of 9
| Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS Kim, HO; Lee, BH; Kim, JT; Choi, JY; Choi, KM; Shin, Youngsoo, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.18, no.3, pp.505 - 509, 2010-03 |
| The effect of Ge composition and Si cap thickness on hot carrier reliability of Si/Si1-xGex/Si p-MOSFETs with high-K/metal gate Cho, Byung Jin; Loh, WY; Majhi, P; Lee, SH; Oh, JW; Sassman, B; Young, C; et al, 2008 Symposium on VLSI Technology, pp.56 - 57, 2008-06-17 |
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