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Ultrafast (50 ns) ID-VGAnalysis on Oxide Thin-Film Transistors With Morphotropic Phase Boundary State High-κ Gate Insulator Jung, Taeseung; Nam, Sooji; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.71, no.5, pp.3009 - 3014, 2024-05 |
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