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Slice Finder: Automated Data Slicing for Model Validation Chung, Yeounoh; Kraska, Tim; Polyzotis, Neoklis; Tae, Ki Hyun; Whang, Steven Euijong, 35th IEEE International Conference on Data Engineering, ICDE 2019, pp.1550 - 1553, IEEE Computer Society, 2019-04 |
TFX: A TensorFlow-based production-scale machine learning platform Baylor, Denis; Breck, Eric; Cheng, Heng-Tze; Fiedel, Noah; Foo, Chuan Yu; Haque, Zakaria; Haykal, Salem; et al, 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, KDD 2017, pp.1387 - 1395, ACM Special Interest Group on Knowledge Discovery and Data Mining (SIGKDD), 2017-08 |
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