Showing results 6 to 7 of 7
Sub-5nm All-Around Gate FinFET for Ultimate Scaling Lee, Hyunjin; Yu, Lee-Eun; Ryu, Seong-Wan; Han, Jin-Woo; Jeon, Kanghoon; Jang, Dong-Yoon; Kim, Kuk-Hwan; et al, IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, 2006-06-13 |
Vacuum gate dielectric gate-all-around nanowire for hot carrier injection and bias temperature instability free transistor Han, Jin-Woo; Moon, Dong-Il; Oh, Jae Sub; Choi, Yang-Kyu; Meyyappan, M., APPLIED PHYSICS LETTERS, v.104, no.25, 2014-06 |
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